IC LA76810A PDF

Ordering number: ENA Monolithic Linear IC LAA For PAL/NTSC Color Television Sets VIF/SIF/Y/Deflection 1chip IC Overview LAA is a. LAA Original Sanyo Integrated Circuit ☞ Don’t be disappointed – Trust only original semiconductors! Brand: Sanyo. China Ic Laa/lab, Ic Laa/lab from China Supplier – Find Variety Ic Laa/lab from flash memory ic chip,power ic,atmega

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PAL Demodulation output ratio 1. No signal 18 Apply a current of 19mA to pin 18 and Initial measure the voltage at pin No signal Apply a voltage of 5. Before measurement, adjust the DAC as follows. SG6 Using an oscilloscope, observe the level at la76810aa 46 and obtain the input level at which the waveform’s p-p value becomes 1.

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SG1 Measure the DC voltage at pin Apply V3 to pin 3 from an external DC power supply. SG4 Set and input the SG4 frequency to Measure the DC voltage at pin 10 at that moment. A beat signal appears. In the same manner, adjust the SG4 frequency to a lower frequency to bring the PLL into unlocked mode. Input signals are input to pin 54 and the carrier frequency is 5.

Set the input frequency to 5. Enter an input signal from pin Initial test state 0IRE signal L Continued on next page. O-2 O-2 at pin 17 at the point where the output signal applied switches to the OSD signal. O-1 of the input signal of the output signal. R, G, and B Bias: R, G, B sel: Input Signals and Test Conditions Unless otherwise specified, the following conditions apply when each measurement is made.

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Set the following conditions unless otherwise specified. No signal unless otherwise specified. Sync is necessary to obtain synchronization. How to calculate the demodulation ratio and angle: The figures below are based on the phase of NTSC. When a PAL signal is generated, adjust the phase and then enter signals. For those other than this, the measurement must be performed for each individual signals. The condition of fsc: N should be a natural number and the nearest value should be used.

Burst only Measure the 8. C-1 21 Refer to 5. Measure the input level at that moment. And then, set the chroma frequency 3.

And then, lla76810a the chroma frequency characteristic CW to 3. No burst signal, chroma signal shall exist below the pedestal level. Initial conditions unless otherwise specified.

Pin 13 vertical size correction circuit input terminal la76810q connected to VCC 5. Connect a frequency counter to the output of pin No signal 27 H out and measure the horizontal free-running frequency. PAL Retrieve data for maximum variation.

H vertical sync signal PAL www. KILL 0 0 Blank. Deff Coring Tint. Test la768110a B. COMP 0 1 V. SC 0 H. SIZE 0 1 H.

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FREQ 0 0 R. B 0 1 Continued on next page. Mute Active Mute Video. Mute Active Mute Sync. Def Gamma Linear Blank.

Test Normal Test Mode Blk. Test Normal Test Mode Color.

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Test Normal Test Mode Video. Test Normal Test Mode Emg. Mute Active Mute de-em TC. Mute 0 HEX Tint. Test 0 HEX H. Kill 0 HEX Color. Test 0 HEX V. Test 4 HEX V. G 20 HEX V. Flesh 0 HEX R. Ext 0 HEX G. Bypass 1 HEX B.

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Threshold 4 HEX B. Def 0 HEX Blank. Def 0 HEX Brt. Def 0 HEX Sub. Bright 40 HEX Mid. Mute 1 1 0 1 0 Video. POSI 3 6 32 63 0 Gray. Test 11 1 0 1 0 B Gammma. Deff 17 1 1 1 0 Coring 17 1 1 1 0 Sharpness 17 6 0 63 0 Tint.

Test 18 1 0 1 0 Tint 18 7 64 0 Color. Test 19 1 0 1 0 Color 19 7 64 0 Video. Test 20 3 4 7 0 Filter. B 23 6 32 63 0 Continued on next page. Test 25 1 0 1 0 Bright. Threshold 25 3 4 7 0 Emg.

Mute 30 1 0 1 0 deem.

To verify symptoms evaluated in an independent device, the customer should always evaluate in the customer’s products or equipment. However, any and all semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to accidents or events that could endanger human lives, that la7810a give rise to smoke or fire, or that could cause damage to other property.

When designing equipment, adopt safety measures so that la76810aa kinds of accidents or events cannot occur. Such measures include but are not limited to protective circuits and error prevention circuits for safe design, redundant design, and structural design. SANYO Semiconductor believes information herein is accurate and reliable, but no guarantees are made or implied regarding its use or any infringements of intellectual property rights or other rights of third parties.

This catalog provides information as of November, Specifications and information herein are subject to change without notice.